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  december 2001 2001 fairchild semiconductor corporation fdc6332c rev c1 (w) FDG6332C 20v n & p-channel powertrench mosfets general description the n & p-channel mosfets are produced using fairchild semiconductor?s advanced powertrench process that has been especially tailored to minimize on-state resistance and yet maintain superior switching performance. these devices have been designed to offer exceptional power dissipation in a very small footprint for applications where the bigger more expensive tssop-8 and ssop-6 packages are impractical. applications dc/dc converter load switch lcd display inverter features q1 0.7 a, 20v. r ds(on) = 300 m w @ v gs = 4.5 v r ds(on) = 400 m w @ v gs = 2.5 v q2 ?0.6 a, ?20v. r ds(on) = 420 m w @ v gs = ?4.5 v r ds(on) = 630 m w @ v gs = ?2.5 v low gate charge high performance trench technology for extremely low r ds(on) sc70-6 package: small footprint (51% smaller than ssot-6); low profile (1mm thick) s g d d g s pin 1 sc70-6 complementary 6 5 4 3 2 1 absolute maximum ratings t a =25 o c unless otherwise noted symbol parameter q1 q2 units v dss drain-source voltage 20 ?20 v v gss gate-source voltage 12 12 v i d drain current ? continuous (note 1) 0.7 ?0.6 a ? pulsed 2.1 ?2 p d power dissipation for single operation (note 1) 0.3 w t j , t stg operating and storage junction temperature range ?55 to +150 c thermal characteristics r q ja thermal resistance, junction-to-ambient (note 1) 415 c/w package marking and ordering information device marking device reel size tape width quantity .32 fdc6332c 7?? 8mm 3000 units FDG6332C
FDG6332C rev c1 (w) electrical characteristics t a = 25c unless otherwise noted symbol parameter test conditions min typ max units off characteristics bv dss drain?source breakdown voltage v gs = 0 v, i d = 250 m a v gs = 0 v, i d = ?250 m a q1 q2 20 ?20 v d bv dss d t j breakdown voltage temperature coefficient i d = 250 m a,ref. to 25 c i d = ?250 m a,ref. to 25 c q1 q2 14 ?14 mv/ c i dss zero gate voltage drain current v ds = 16 v, v gs = 0 v v ds = ?16 v, v gs = 0 v q1 q2 1 ?1 m a i gssf /i gssr gate?body leakage, forward v gs = 12 v, v ds = 0 v 100 na i gssf /i gssr gate?body leakage, reverse v gs = 12v , v ds = 0 v 100 na on characteristics (note 2) v gs( th ) q1 v ds = v gs , i d = 250 m a 0.6 1.1 1.5 gate threshold voltage q2 v ds = v gs , i d = ?250 m a -0.6 ?1.2 ?1.5 v d v gs( th) d t j gate threshold voltage temperature coefficient q1 q2 i d = 250 m a ,ref . to 25 c i d = ?250 m a,ref. to 25 c ?2.8 3 mv/ c r ds(on) q1 v gs = 4.5 v, i d =0.7 a v gs = 2.5 v, i d =0.6 a v gs = 4.5 v, i d =0.7a,t j =125 c 180 293 247 300 400 442 static drain?source on?resistance q2 v g s = ?4.5 v, i d = ?0.6 a v gs = ?2.5 v, i d = ?0.5 a v gs =?4.5 v, i d =?0.6 a,t j =125 c 300 470 400 420 630 700 m w g fs q1 v ds = 5 v i d = 0.7 a 2.8 forward transconductance q2 v ds = ?5 v i d = ?0.6a 1.8 s i d(on) q1 v gs = 4.5 v, v ds = 5 v 1 on?state drain current q2 v gs = ?4.5 v, v ds = ?5 v ?2 a dynamic characteristics c iss q1 v ds =10 v, v gs = 0 v, f=1.0mhz 113 input capacitance q2 v ds =?10 v, v gs = 0 v, f=1.0mhz 114 pf c oss q1 v ds =10 v, v gs = 0 v, f=1.0mhz 34 output capacitance q2 v ds =?10 v, v gs = 0 v, f=1.0mhz 24 pf c rss q1 v ds =10 v, v gs = 0 v, f=1.0mhz 16 reverse transfer capacitance q2 v ds =?10 v, v gs = 0 v, f=1.0mhz 9 pf switching characteristics (note 2) t d(on) q1 5 10 turn?on delay time q2 5.5 11 ns t r q1 7 15 turn?on rise time q2 14 25 ns t d(off) q1 9 18 turn?off delay time q2 6 12 ns t f q1 1.5 3 turn?off fall time q2 for q1 : v ds =10 v, i d = 1 a v g s = 4.5 v, r gen = 6 w for q2 : v ds =?10 v, i d = ?1 a v gs = ?4.5 v, r gen = 6 w 1.7 3.4 ns q g q1 1.1 1.5 total gate charge q2 1.4 2 nc q gs q1 0.24 gate?source charge q2 0.3 nc q gd q1 0.3 gate?drain charge q2 for q1 : v ds =10 v, i d = 0.7 a v gs = 4.5 v, r gen = 6 w for q2 : v ds =?10 v, i d = ?0.6 a v gs = ?4.5 v, r gen = 6 w 0.4 nc FDG6332C
FDG6332C rev c1 (w) electrical characteristics t a = 25c unless otherwise noted symbol parameter test conditions min typ max units drain?source diode characteristics and maximum ratings i s q1 0.25 maximum continuous drain?source diode forward current q2 ?0.25 a v sd q1 v gs = 0 v, i s = 0.25 a (note 2) 0.74 1.2 drain?source diode forward voltage q2 v gs = 0 v, i s = ?0.25 a (note 2) ?0.77 ?1.2 v notes: 1. r q ja is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins. r q jc is guaranteed by design while r q ja is determined by the user's board design. r q ja = 415c/w when mounted on a minimum pad of fr-4 pcb in a still air environment. 2. pulse test: pulse width < 300 m s, duty cycle < 2.0% FDG6332C
FDG6332C rev c1 (w) typical characteristics: n-channel 0 1 2 3 4 0 1 2 3 4 v ds , drain-source voltage (v) i d , drain current (a) 2.0v 3.0v v gs =4.5v 2.5v 3.5v 0.8 1 1.2 1.4 1.6 1.8 0 1 2 3 4 i d , drain current (a) r ds(on) , normalized drain-source on-resistance v gs = 2.5v 3.0v 4.0v 3.5v 4.5v figure 1. on-region characteristics. figure 2. on-resistance variation with drain current and gate voltage. 0.6 0.8 1 1.2 1.4 1.6 -50 -25 0 25 50 75 100 125 150 t j , junction temperature ( o c) r ds(on) , normalized drain-source on-resistance i d =0.7a v gs = 4.5v 0 0.2 0.4 0.6 0.8 1 2 3 4 5 v gs , gate to source voltage (v) r ds(on) , on-resistance (ohm) i d =0.4a t a = 125 o c t a = 25 o c figure 3. on-resistance variation with temperature. figure 4. on-resistance variation with gate-to-source voltage. 0 0.5 1 1.5 2 2.5 0.5 1 1.5 2 2.5 3 v gs , gate to source voltage (v) i d , drain current (a) t a = -55 o c 25 o c 125 o c v ds = 5v 0.0001 0.001 0.01 0.1 1 10 0 0.2 0.4 0.6 0.8 1 1.2 v sd , body diode forward voltage (v) i s , reverse drain current (a) t a = 125 o c 25 o c -55 o c v gs = 0v figure 5. transfer characteristics. figure 6. body diode forward voltage variation with source current and temperature. fdg63 3 2c
FDG6332C rev c1 (w) typical characteristics: n-channel 0 1 2 3 4 5 0 0.4 0.8 1.2 1.6 q g , gate charge (nc) v gs , gate-source voltage (v) i d = 0.7a v ds = 5v 15v 10v 0 50 100 150 200 0 5 10 15 20 v ds , drain to source voltage (v) capacitance (pf) c iss c rss c oss f = 1mhz v gs = 0 v figure 7. gate charge characteristics. figure 8. capacitance characteristics. 0.01 0.1 1 10 0.1 1 10 100 v ds , drain-source voltage (v) i d , drain current (a) dc 1s 100ms 100 m s r ds(on) limit v gs = 4.5v single pulse r q ja = 415 o c/w t a = 25 o c 10ms 1ms 0 2 4 6 8 10 0.001 0.01 0.1 1 10 100 t 1 , time (sec) p(pk), peak transient power (w) single pulse r q ja = 415c/w t a = 25c figure 9. maximum safe operating area. figure 10. single pulse maximum power dissipation. fdg633 2c
FDG6332C rev c1 (w) typical characteristics: p-channel 0 0.4 0.8 1.2 1.6 2 0 1 2 3 4 -v ds , drain-source voltage (v) -i d , drain current (a) -3.5v -2.5v -2.0v v gs = -4.5v -3.0v 0.8 1 1.2 1.4 1.6 1.8 0 0.5 1 1.5 2 -i d , drain current (a) r ds(on) , normalized drain-source on-resistance v gs = -2.5v -3.0v -3.5v -4.5v -4.0v figure 11. on-region characteristics. figure 12. on-resistance variation with drain current and gate voltage. 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 -50 -25 0 25 50 75 100 125 150 t j , junction temperature ( o c) r ds(on) , normalized drain-source on-resistance i d = -0.6a v gs = -4.5v 0.2 0.4 0.6 0.8 1 1.2 1 2 3 4 5 -v gs , gate to source voltage (v) r ds(on) , on-resistance (ohm) i d = -0.3 a t a = 125 o c t a = 25 o c figure 13. on-resistance variation with temperature. figure 14. on-resistance variation with gate-to-source voltage. 0 0.5 1 1.5 2 0.5 1 1.5 2 2.5 3 -v gs , gate to source voltage (v) -i d , drain current (a) t a = -55 o c 25 o c 125 o c v ds = -5v 0.0001 0.001 0.01 0.1 1 10 0 0.2 0.4 0.6 0.8 1 1.2 -v sd , body diode forward voltage (v) -i s , reverse drain current (a) t a = 125 o c 25 o c -55 o c v gs = 0v figure 15. transfer characteristics. figure 16. body diode forward voltage variation with source current and temperature. fdg63 3 2c
FDG6332C rev c1 (w) typical characteristics : p-channel 0 1 2 3 4 5 0 0.3 0.6 0.9 1.2 1.5 1.8 q g , gate charge (nc) -v gs , gate-source voltage (v) i d = -0.6a v ds = -5v -15v -10v 0 40 80 120 160 0 5 10 15 20 -v ds , drain to source voltage (v) capacitance (pf) c iss c rss c oss f = 1mhz v gs = 0 v figure 17. gate charge characteristics. figure 18. capacitance characteristics. 0.01 0.1 1 10 0.1 1 10 100 -v ds , drain-source voltage (v) -i d , drain current (a) dc 1s 100ms 10ms 1ms 100 m s r ds(on) limit v gs = -4.5v single pulse r q ja = 415 o c/w t a = 25 o c 0 2 4 6 8 10 0.001 0.01 0.1 1 10 100 single pulse time (sec) power (w) single pulse r q ja = 415 o c/w t a = 25 o c figure 19. maximum safe operating area. figure 20. single pulse maximum power dissipation. 0.001 0.01 0.1 1 0.0001 0.001 0.01 0.1 1 10 100 t 1 , time (sec) r(t), normalized effective transient thermal resistance r q ja (t) = r(t) * r q ja r q ja = 415 c/w t j - t a = p * r q ja (t) duty cycle, d = t 1 / t 2 p(pk) t 1 t 2 single pulse 0.01 0.02 0.05 0.1 0.2 d = 0.5 figure 21. transient thermal response curve. thermal characterization performed using the conditions described in note 1. transient thermal response will change depending on the circuit board design. fdg633 2c
disclaimer fairchild semiconductor reserves the right to make changes without further notice t o any products herein t o improve reliability , function or design. fairchild does not assume any liability arising out of the applica tion or use of any product or circuit described herein; neither does it convey any license under its p a tent rights, nor the rights of others. trademarks the following are registered and unregistered trademarks fairchild semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. life support policy fairchild?s products are not authorized for use as critical components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user. 2. a critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms datasheet identification product status definition advance information preliminary no identification needed obsolete this datasheet contains the design specifications for product development. specifications may change in any manner without notice. this datasheet contains preliminary data, and supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains final specifications. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains specifications on a product that has been discontinued by fairchild semiconductor. the datasheet is printed for reference information only. formative or in design first production full production not in production optologic? optoplanar? pacman? pop? power247? powertrench qfet? qs? qt optoelectronics? quiet series? silent switcher fast fastr? frfet? globaloptoisolator? gto? hisec? isoplanar? littlefet? microfet? micropak? microwire? rev. h4 a acex? bottomless? coolfet? crossvolt ? densetrench? dome? ecospark? e 2 cmos tm ensigna tm fact? fact quiet series? smart start? star*power? stealth? supersot?-3 supersot?-6 supersot?-8 syncfet? tinylogic? trutranslation? uhc? ultrafet a a a star*power is used under license vcx?


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